The CBIS Cryoelectron Microscope Facility is a prominent member of a select group of state-of-the-art, high-end cryoelectron microscopy facilities in the world. By minimizing EMI, reducing relative humidity to 30%, and together with the exceptionally quiet acoustic and low mechanical vibration levels, all microscopes in the facility are able to easily reach designed performance specifications. From this perspective both FEI and JEOL have informed us that the Centre is among their best TEM installations world-wide.
The Cryoelectron Microscope Facility currently houses the following equipment
- the FEI Titan Krios Cryo-TEM
- the FEI TECNAI T12 TEM
- the JEOL JEM 2010F TEM
- the JEOL 2200FS
- the JEOL JSM 6510 SEM (S1 Level 2)
- the FEI HELIOS Dual Beam (S1 Level 2)
- sample preparation equipment
In addition to the four TEMs, the 30% RH rooms also contain instruments for cryofreezing of samples and cryosectioning. A separate room in S1A houses a high-pressure freezing instrument for ultra-fast freezing of thick samples.
The instruments are supported and maintained by excellent technical staff trained in biological sample preparation and imaging. The CBIS Cryoelectron Microscopy Facility is the most advanced TEM facility in Singapore and offers use of their equipment and resources at competitive rates. Learn more about reserving CBIS CryoEM facilities.
CBIS Electron Microscopes
FEI Titan Krios
300kV, FEG, 4k x 4k FEI-Falcon direct detector, and Gatan Tridiem GIF with 2k x 2k post-GIF Gatan CCD
The FEI Titan Krios has an accelerating voltage of 300 KV with a field emission gun. It is mainly used for Cryo-TEM imaging and diffraction pattern with a 4k x 4k Ultrascan camera, US4000 with Gatan Tridiem energy-filter (EFTEM). It can also be used for room temperature and cryo-tomography, able to achieve magnifications of 740K. It has remote computer control.
Recently the Krios has been upgraded with a Falcon II direct detector, which is optimized for low contrast and low dose imaging with 16M pixels. FEI’s direct electron CMOS technology ensures a direct translation from electrons toward the image—without the interference of an optically coupled device. Plus, our ultrathin, back-thinned sensor ensures a DQE that’s over 50% higher at ½ Nyquist than the first generation Falcon and up to 5x better than any regular CCD.
FEI Tecnai T12
The FEI Tecnai T12 has a LaB6 filament and goes up to 120 KV. It is used for conventional and cryo-TEM and is able to reach a maximum magnification of 740K.
The T12 is used for imaging and diffraction pattern and both room temperature and cryo-tomography. It is equipped with an Orius (TV) 4k x 3k camera able to record movie/video.
JEOL JEM 2010F HRTEM
JEOL JEM 2010F HRTEM which has a field emission gun with an accelerating voltage of 200 KV.
The 2010F is used for conventional TEM imaging (including lattice imaging) up to a maximum magnification of 800K and diffraction pattern. It has a 4k x 4k ultrascan US4000 camera. It comes with a Cryo-TEM holder and cost about 1 million.
JEOL JSM 6510 SEM
DBS has a JEOL JSM 6510 SEM with a Tungsten filament that can be used for Low Vacuum / High Vacuum SEM for 0.5 to 30 KV. The magnification range available is from 5x to 300K times.
The new TEM is equipped with field emission gun, high resolution cryo-pole-piece, in-column omega energy filter and Zernike phase plate, and latest electron DE-12 direct detector. By using Zernike phase plate, the sin-shape of contrast transfer function will be converted into cosine-shape instead and the low-resolution information is high naturally. Hence, the visibility of biological specimens will be enhanced dramatically. Particularly, specimens less than 200kDa which are hardly visible with normal cryoEM will stand out very well with the phase plate. The microscope will be used for research projects that study protein complexes, virus, virus-like particles, bacterial, and cell and tissue specimens at both liquid nitrogen temperature and room temperature.
FEI Helios Dual Beam
FEG HRSEM and Focused Ion Beam, ETD and TLD detectors
DBS/CBIS also houses a FEI Helios Dual Beam in S1 Level 2. It has a focused ion beam (Ga) and electron beam (FEG) SEM. It is used for slice-and-view for large volume 3D tomography, up to several hundreds of microns. It bridges the gap between Laser confocal and TEM tomography.
Other sample preparation equipment
- Cressington 208
- Embedding oven
- Emitech K100X Glow Discharge Unit
- Emitech K975X C Coater
- FEI Vitrobot for cryo sample preparation
- High Pressure Freezing machine Compact 01 (S1A Level 2)
- JEOL DATAM HDT-400 Hydrophilic Treatment Device
- JEOL JFC 1600 Pt Fine Coater
- JEOL JFC-1100 Au Ion Sputter
- Leica Freeze Substitution Machine (S1A Level 2)
- Leica Ultracut UCT & EM FCS
- Leica Ultracut EM UCT & EM FC7
- Plasma cleaner/ Hydrophilic treatment device
- Reichert Jung Ultracut E (ultra-tome for conventional sectioning)
- Tousimis Critical Point Dryer (Autosamdri 815)
Procedure for use of the CBIS Cryoelectron Microscopy Facility
- The applicant (and/or his/her supervisor/PI) is required to schedule a meeting with the Cryo-EM Facility staff for project assessment. The Cryo-EM Facility staff will help to identify suitable techniques, instruments and training for the project. The Cryo-EM Facility staff will review the Facility’s official policies, safety regulations, training requirements, and rate scheme with the applicant.
- The applicant is required to submit an application form along with a risk assessment and research plan to the Cryo-EM Facility staff to register a user account in the online booking system. The applicant’s supervisor/PI needs to sign the form and accept the terms and conditions of using Cryo-EM Facility.
- The applicant is required to schedule training with Cryo-EM Facility staff . The applicant should study all training materials prior to the training.
- The trainee is required to practice after training under the supervision of the CBIS Cryo-EM Facility staff to become a proficient and independent user.
- The applicant will only be granted independent user status after he/she has passed the qualification exam on the trained equipment. Thereafter he/she will be allowed to use the instruments independently including booking instrument time through the online system.
- The user’s independent status may be revoked and the user barred from the Facility if he/she is found in violation of Facility rules and regulations, of damaging instruments with reckless activities and/or for failing to pay their fees on time.