Fast electron detectors are rapidly changing electron microscopy. These detectors allow probabilistic imaging of very many noisy, incomplete, chance observations that are then statistically classified and interpreted. This mode of imaging has enabled unprecedented high resolution imaging of dynamical and heterogeneous systems.
The Centre for BioImaging Sciences at the National University of Singapore is one of the few places in the world that develops new algorithmic approaches in such probabilistic electron microscopy. We are looking for motivated, aspiring scientists who would like to join us in developing this emerging field of statistical electron microscopy.